Scanning Electron Microscope (SEM)
Equipment : Scanning Electron Microscope (SEM)
Brand/Type : Hitachi SU-3500
Function : SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. All new electron optics design with best-in-class image sharpness.
Wide screen GUI and fast auto image optimization functions (7 seconds) via “delegation” technology. Ultra Variable-Pressure Detector: image surface information at low vacuum and low accelerating voltages. Stereoscopic image function: point and click for seamless, real-time 3D image observation.